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Reliability Challenges (from the source)

Discussion in 'Technical' started by 10pele, Jan 26, 2015.

  1. 10pele

    10pele Member

    Oct 30, 2013
    S.F. Bay Area
    To: [email protected]
    Subject: REGISTER NOW: [IEEE-REL] (Feb 5) Tesla Reliability Challenges and Opportunities

    IEEE Santa Clara Valley Reliability Chapter February Meeting

    Title: Tesla Reliability Challenges and Opportunities
    Invited Speaker: Dr. Jiliang Zhang, Tesla Motors, Fremont, CA
    Date: Thursday, February 5, 2015
    Time: Check in and food at 6:00PM - 6:30 PM. Presentation from 6:30 PM to 7:30 PM.
    Location: Kennedy commons (Bldg #309) on Kennedy Mall, Santa Clara University, 500 El Camino Real, Santa Clara, CA, 95053 (Map, Street View). Parking: Street parking available close to the conference room and is FREE after 6PM. Parking is $4 on campus (Map).

    Abstract: There are serious challenges to Tesla vehicle reliability in term of required reliability, short product development cycle, complexity of the product, number of suppliers, etc. In addition, there are tremendous opportunities at Tesla in terms of reliability emphasis, business model uniqueness, data/statistics driven culture, technology and process innovation etc. Tesla’s goal is to build up a unique reliability program that takes the advantages of both traditional automotive reliability and high tech reliability. This presentation focuses on Tesla unique automotive OEM reliability program development. Our innovative approaches in reliability goal setting and allocation, prior knowledge utilization, distributional usage based accelerated reliability test design, field reliability evaluation, etc. Future directions in Tesla reliability program will also be discussed.

    Speaker Biography: Dr. Jiliang Zhang is a Staff Reliability Engineer at Tesla Motors. He has more than 15 years of reliability and quality professional experience in printer, consumer electronics, and automotive industries. Dr. Zhang’s experience includes reliability program development, reliability test design, test and field data analysis as well as Design-for-Reliability. He has worked for Hewlett-Packard Co. and Amazon Kindle Hardware in product reliability and product quality. He received his Ph. D. in Reliability Engineering from the University of Arizona, which he attended from 1995 to 1999. He received his B.S. in 1983 and M.S in 1986 in Heat Energy Engineering, both from Hauzhong University of Science and Technology, China.

    Admission: Open to all IEEE members and non-members for FREE.
    Register here:

    Attendance to this seminar will count towards professional development hours for IEEE, ASQ…

    Please feel free to forward this message to your friends and colleagues. Google IEEE SCV Reliability for our website for more information.

    Guneet Sethi, PhD, CRE
    IEEE SCV Rel Chair
    Email: [email protected]

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